BibTeX record journals/mr/LeeBHW17

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@article{DBLP:journals/mr/LeeBHW17,
  author       = {Hosung Lee and
                  Sanghyeon Baeg and
                  Nelson Hua and
                  Shi{-}Jie Wen},
  title        = {Temporal and frequency characteristic analysis of margin-related failures
                  caused by an intermittent nano-scale fracture of the solder ball in
                  a {BGA} package device},
  journal      = {Microelectron. Reliab.},
  volume       = {69},
  pages        = {88--99},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2016.12.010},
  doi          = {10.1016/J.MICROREL.2016.12.010},
  timestamp    = {Sat, 22 Feb 2020 19:28:31 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LeeBHW17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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