BibTeX record journals/mr/LiWLZFL16

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@article{DBLP:journals/mr/LiWLZFL16,
  author    = {Junxing Li and
               Zhihua Wang and
               Xia Liu and
               Yongbo Zhang and
               Huimin Fu and
               Chengrui Liu},
  title     = {A Wiener process model for accelerated degradation analysis considering
               measurement errors},
  journal   = {Microelectronics Reliability},
  volume    = {65},
  pages     = {8--15},
  year      = {2016},
  url       = {https://doi.org/10.1016/j.microrel.2016.08.004},
  doi       = {10.1016/j.microrel.2016.08.004},
  timestamp = {Thu, 28 Dec 2017 16:11:54 +0100},
  biburl    = {https://dblp.org/rec/bib/journals/mr/LiWLZFL16},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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