BibTeX record journals/mr/MiaoZSHL15

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@article{DBLP:journals/mr/MiaoZSHL15,
  author       = {Meng Miao and
                  Yuanzhong (Paul) Zhou and
                  Javier A. Salcedo and
                  Jean{-}Jacques Hajjar and
                  Juin J. Liou},
  title        = {Compact failure modeling for devices subject to electrostatic discharge
                  stresses - {A} review pertinent to {CMOS} reliability simulation},
  journal      = {Microelectron. Reliab.},
  volume       = {55},
  number       = {1},
  pages        = {15--23},
  year         = {2015},
  url          = {https://doi.org/10.1016/j.microrel.2014.10.015},
  doi          = {10.1016/J.MICROREL.2014.10.015},
  timestamp    = {Sat, 22 Feb 2020 19:28:14 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/MiaoZSHL15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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