BibTeX record journals/mr/MutchPBCLLNBFKF16

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@article{DBLP:journals/mr/MutchPBCLLNBFKF16,
  author       = {Michael J. Mutch and
                  Thomas Pomorski and
                  Brad C. Bittel and
                  Corey J. Cochrane and
                  Patrick M. Lenahan and
                  Xin Liu and
                  Robert J. Nemanich and
                  Justin Brockman and
                  Marc French and
                  Markus Kuhn and
                  Benjamin French and
                  Sean W. King},
  title        = {Band diagram for low-k/Cu interconnects: The starting point for understanding
                  back-end-of-line {(BEOL)} electrical reliability},
  journal      = {Microelectron. Reliab.},
  volume       = {63},
  pages        = {201--213},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.04.004},
  doi          = {10.1016/J.MICROREL.2016.04.004},
  timestamp    = {Sat, 22 Feb 2020 19:28:57 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/MutchPBCLLNBFKF16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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