BibTeX record journals/mr/MuzykovKZCBAS09

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@article{DBLP:journals/mr/MuzykovKZCBAS09,
  author       = {Peter G. Muzykov and
                  Robert M. Kennedy and
                  Qingchun Zhang and
                  Craig Capell and
                  Al Burk and
                  Anant Agarwal and
                  Tangali S. Sudarshan},
  title        = {Physical phenomena affecting performance and reliability of 4H-SiC
                  bipolar junction transistors},
  journal      = {Microelectron. Reliab.},
  volume       = {49},
  number       = {1},
  pages        = {32--37},
  year         = {2009},
  url          = {https://doi.org/10.1016/j.microrel.2008.10.009},
  doi          = {10.1016/J.MICROREL.2008.10.009},
  timestamp    = {Sat, 22 Feb 2020 19:29:20 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/MuzykovKZCBAS09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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