BibTeX record journals/mr/Ortiz-CondeGMMRHL09

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@article{DBLP:journals/mr/Ortiz-CondeGMMRHL09,
  author       = {Adelmo Ortiz{-}Conde and
                  Francisco J. Garc{\'{\i}}a{-}S{\'{a}}nchez and
                  Juan Muci and
                  Denise C. Lugo Mu{\~{n}}oz and
                  {\'{A}}lvaro D. Latorre Rey and
                  Ching{-}Sung Ho and
                  Juin J. Liou},
  title        = {Indirect fitting procedure to separate the effects of mobility degradation
                  and source-and-drain resistance in {MOSFET} parameter extraction},
  journal      = {Microelectron. Reliab.},
  volume       = {49},
  number       = {7},
  pages        = {689--692},
  year         = {2009},
  url          = {https://doi.org/10.1016/j.microrel.2009.05.005},
  doi          = {10.1016/J.MICROREL.2009.05.005},
  timestamp    = {Sat, 22 Feb 2020 19:27:12 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/Ortiz-CondeGMMRHL09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}