BibTeX record journals/mr/RahmanEAD09

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@article{DBLP:journals/mr/RahmanEAD09,
  author       = {M. S. Rahman and
                  E. K. Evangelou and
                  I. I. Androulidakis and
                  Athanasios Dimoulas},
  title        = {Study of stress-induced leakage current {(SILC)} in HfO\({}_{\mbox{2}}\)/Dy\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\)
                  high-kappa gate stacks on germanium},
  journal      = {Microelectron. Reliab.},
  volume       = {49},
  number       = {1},
  pages        = {26--31},
  year         = {2009},
  url          = {https://doi.org/10.1016/j.microrel.2008.10.005},
  doi          = {10.1016/J.MICROREL.2008.10.005},
  timestamp    = {Thu, 05 Nov 2020 17:00:27 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/RahmanEAD09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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