BibTeX record journals/mr/RaskinSBR07

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@article{DBLP:journals/mr/RaskinSBR07,
  author       = {Yosef Raskin and
                  Asaad Salameh and
                  David Betel and
                  Yakov Roizin},
  title        = {Reliability of {HTO} based high-voltage gate stacks for flash memories},
  journal      = {Microelectron. Reliab.},
  volume       = {47},
  number       = {4-5},
  pages        = {615--618},
  year         = {2007},
  url          = {https://doi.org/10.1016/j.microrel.2007.01.041},
  doi          = {10.1016/J.MICROREL.2007.01.041},
  timestamp    = {Sat, 22 Feb 2020 19:29:01 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/RaskinSBR07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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