BibTeX record journals/mr/VargheseRKA14

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@article{DBLP:journals/mr/VargheseRKA14,
  author       = {Dhanoop Varghese and
                  V. Reddy and
                  S. Krishnan and
                  Muhammad Ashraful Alam},
  title        = {OFF-state degradation and correlated gate dielectric breakdown in
                  high voltage drain extended transistors: {A} review},
  journal      = {Microelectron. Reliab.},
  volume       = {54},
  number       = {8},
  pages        = {1477--1488},
  year         = {2014},
  url          = {https://doi.org/10.1016/j.microrel.2014.03.013},
  doi          = {10.1016/J.MICROREL.2014.03.013},
  timestamp    = {Mon, 09 May 2022 18:11:21 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/VargheseRKA14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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