BibTeX record journals/mr/WatanabeTKSO07

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@article{DBLP:journals/mr/WatanabeTKSO07,
  author       = {Kazufumi Watanabe and
                  Akinobu Teramoto and
                  Rihito Kuroda and
                  Shigetoshi Sugawa and
                  Tadahiro Ohmi},
  title        = {Examination of degradation mechanism due to negative bias temperature
                  stress from a perspective of hole energy for accurate lifetime prediction},
  journal      = {Microelectron. Reliab.},
  volume       = {47},
  number       = {2-3},
  pages        = {409--418},
  year         = {2007},
  url          = {https://doi.org/10.1016/j.microrel.2006.06.001},
  doi          = {10.1016/J.MICROREL.2006.06.001},
  timestamp    = {Mon, 26 Oct 2020 08:59:29 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/WatanabeTKSO07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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