BibTeX record journals/mr/WuSYLS08

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@article{DBLP:journals/mr/WuSYLS08,
  author       = {Hong Wu and
                  Weifeng Sun and
                  Yangbo Yi and
                  Haisong Li and
                  Longxing Shi},
  title        = {The degradation mechanisms in high voltage pLEDMOS transistor with
                  thick gate oxide},
  journal      = {Microelectron. Reliab.},
  volume       = {48},
  number       = {11-12},
  pages        = {1804--1808},
  year         = {2008},
  url          = {https://doi.org/10.1016/j.microrel.2008.09.002},
  doi          = {10.1016/J.MICROREL.2008.09.002},
  timestamp    = {Sat, 22 Feb 2020 19:28:15 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/WuSYLS08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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