BibTeX record journals/mr/YarimbiyikSAVZ09

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@article{DBLP:journals/mr/YarimbiyikSAVZ09,
  author       = {A. Emre Yarimbiyik and
                  Harry A. Schafft and
                  Richard A. Allen and
                  Mark D. Vaudin and
                  Mona E. Zaghloul},
  title        = {Experimental and simulation studies of resistivity in nanoscale copper
                  films},
  journal      = {Microelectron. Reliab.},
  volume       = {49},
  number       = {2},
  pages        = {127--134},
  year         = {2009},
  url          = {https://doi.org/10.1016/j.microrel.2008.11.003},
  doi          = {10.1016/J.MICROREL.2008.11.003},
  timestamp    = {Thu, 14 Oct 2021 09:38:50 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/YarimbiyikSAVZ09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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