BibTeX record journals/mr/YeZCLWZ18

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@article{DBLP:journals/mr/YeZCLWZ18,
  author       = {Xuerong Ye and
                  Kaixin Zhang and
                  Cen Chen and
                  Zhongwei Li and
                  Yue Wang and
                  Guofu Zhai},
  title        = {The threshold voltage degradation model of {N} Channel VDMOSFETs under
                  {PBT} stress},
  journal      = {Microelectron. Reliab.},
  volume       = {91},
  pages        = {46--51},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2018.08.003},
  doi          = {10.1016/J.MICROREL.2018.08.003},
  timestamp    = {Sat, 22 Feb 2020 19:28:41 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/YeZCLWZ18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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