BibTeX record journals/mr/YuYWW11

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@article{DBLP:journals/mr/YuYWW11,
  author       = {Fong{-}Jung Yu and
                  Yung{-}Yu Yang and
                  Ming{-}Jaan Wang and
                  Zhang Wu},
  title        = {Using {EWMA} control schemes for monitoring wafer quality in negative
                  binomial process},
  journal      = {Microelectron. Reliab.},
  volume       = {51},
  number       = {2},
  pages        = {400--405},
  year         = {2011},
  url          = {https://doi.org/10.1016/j.microrel.2010.07.151},
  doi          = {10.1016/J.MICROREL.2010.07.151},
  timestamp    = {Sat, 22 Feb 2020 19:27:38 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/YuYWW11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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