BibTeX record journals/scjapan/MiuraWK93

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@article{DBLP:journals/scjapan/MiuraWK93,
  author       = {Yukiya Miura and
                  Yasushi Wada and
                  Kozo Kinoshita},
  title        = {Design of testing circuit and test generation for built-in current
                  testing},
  journal      = {Syst. Comput. Jpn.},
  volume       = {24},
  number       = {5},
  pages        = {73--82},
  year         = {1993},
  url          = {https://doi.org/10.1002/scj.4690240507},
  doi          = {10.1002/SCJ.4690240507},
  timestamp    = {Wed, 13 Sep 2023 17:54:15 +0200},
  biburl       = {https://dblp.org/rec/journals/scjapan/MiuraWK93.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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