BibTeX record journals/tc/MeyerP03

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@article{DBLP:journals/tc/MeyerP03,
  author       = {Fred J. Meyer and
                  Nohpill Park},
  title        = {Predicting Defect-Tolerant Yield in the Embedded Core Context},
  journal      = {{IEEE} Trans. Computers},
  volume       = {52},
  number       = {11},
  pages        = {1470--1479},
  year         = {2003},
  url          = {https://doi.org/10.1109/TC.2003.1244944},
  doi          = {10.1109/TC.2003.1244944},
  timestamp    = {Sat, 20 May 2017 00:24:35 +0200},
  biburl       = {https://dblp.org/rec/journals/tc/MeyerP03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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