BibTeX record journals/tcad/DiazKD94

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@article{DBLP:journals/tcad/DiazKD94,
  author       = {Carlos H. D{\'{\i}}az and
                  Sung{-}Mo Kang and
                  Charvaka Duvvury},
  title        = {Circuit-level electrothermal simulation of electrical overstress failures
                  in advanced {MOS} {I/O} protection devices},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {13},
  number       = {4},
  pages        = {482--493},
  year         = {1994},
  url          = {https://doi.org/10.1109/43.275358},
  doi          = {10.1109/43.275358},
  timestamp    = {Thu, 24 Sep 2020 11:27:20 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/DiazKD94.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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