BibTeX record journals/tcad/LeeCKK18

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@article{DBLP:journals/tcad/LeeCKK18,
  author       = {Hayoung Lee and
                  Kiwon Cho and
                  Donghyun Kim and
                  Sungho Kang},
  title        = {Fault Group Pattern Matching With Efficient Early Termination for
                  High-Speed Redundancy Analysis},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {37},
  number       = {7},
  pages        = {1473--1482},
  year         = {2018},
  url          = {https://doi.org/10.1109/TCAD.2017.2760505},
  doi          = {10.1109/TCAD.2017.2760505},
  timestamp    = {Tue, 27 Feb 2024 16:41:39 +0100},
  biburl       = {https://dblp.org/rec/journals/tcad/LeeCKK18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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