BibTeX record journals/tcad/LeeTLC12

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@article{DBLP:journals/tcad/LeeTLC12,
  author       = {Lung{-}Jen Lee and
                  Wang{-}Dauh Tseng and
                  Rung{-}Bin Lin and
                  Cheng{-}Ho Chang},
  title        = {{\textdollar}2{\^{}}\{n\}{\textdollar} Pattern Run-Length for Test
                  Data Compression},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {31},
  number       = {4},
  pages        = {644--648},
  year         = {2012},
  url          = {https://doi.org/10.1109/TCAD.2011.2176733},
  doi          = {10.1109/TCAD.2011.2176733},
  timestamp    = {Thu, 24 Sep 2020 11:27:30 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/LeeTLC12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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