BibTeX record journals/tcad/MukhopadhyayRR05

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@article{DBLP:journals/tcad/MukhopadhyayRR05,
  author       = {Saibal Mukhopadhyay and
                  Arijit Raychowdhury and
                  Kaushik Roy},
  title        = {Accurate estimation of total leakage in nanometer-scale bulk {CMOS}
                  circuits based on device geometry and doping profile},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {24},
  number       = {3},
  pages        = {363--381},
  year         = {2005},
  url          = {https://doi.org/10.1109/TCAD.2004.842810},
  doi          = {10.1109/TCAD.2004.842810},
  timestamp    = {Thu, 24 Sep 2020 11:28:20 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/MukhopadhyayRR05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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