BibTeX record journals/tcad/PradhanL05

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@article{DBLP:journals/tcad/PradhanL05,
  author    = {Dhiraj K. Pradhan and
               Chunsheng Liu},
  title     = {{EBIST:} a novel test generator with built-in fault detection capability},
  journal   = {{IEEE} Trans. on {CAD} of Integrated Circuits and Systems},
  volume    = {24},
  number    = {9},
  pages     = {1457--1466},
  year      = {2005},
  url       = {https://doi.org/10.1109/TCAD.2005.850815},
  doi       = {10.1109/TCAD.2005.850815},
  timestamp = {Sat, 20 May 2017 00:23:54 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/tcad/PradhanL05},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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