BibTeX record journals/tcad/RaviLJ00

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@article{DBLP:journals/tcad/RaviLJ00,
  author    = {Srivaths Ravi and
               Ganesh Lakshminarayana and
               Niraj K. Jha},
  title     = {{TAO-BIST:} {A} framework for testability analysis and optimization
               forbuilt-in self-test of {RTL} circuits},
  journal   = {{IEEE} Trans. on {CAD} of Integrated Circuits and Systems},
  volume    = {19},
  number    = {8},
  pages     = {894--906},
  year      = {2000},
  url       = {https://doi.org/10.1109/43.856976},
  doi       = {10.1109/43.856976},
  timestamp = {Sat, 20 May 2017 00:23:47 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/tcad/RaviLJ00},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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