BibTeX record journals/tcad/SureshK16

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@article{DBLP:journals/tcad/SureshK16,
  author       = {Vikram B. Suresh and
                  Sandip Kundu},
  title        = {Managing Test Coverage Uncertainty due to Random Noise in Nano-CMOS:
                  {A} Case-Study on an {SRAM} Array},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {35},
  number       = {1},
  pages        = {155--165},
  year         = {2016},
  url          = {https://doi.org/10.1109/TCAD.2015.2449236},
  doi          = {10.1109/TCAD.2015.2449236},
  timestamp    = {Thu, 24 Sep 2020 11:28:46 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/SureshK16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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