BibTeX record journals/tcad/VariyamC00

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@article{DBLP:journals/tcad/VariyamC00,
  author    = {Pramodchandran N. Variyam and
               Abhijit Chatterjee},
  title     = {Specification-driven test generation for analog circuits},
  journal   = {{IEEE} Trans. on {CAD} of Integrated Circuits and Systems},
  volume    = {19},
  number    = {10},
  pages     = {1189--1201},
  year      = {2000},
  url       = {https://doi.org/10.1109/43.875320},
  doi       = {10.1109/43.875320},
  timestamp = {Sat, 20 May 2017 00:23:49 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/tcad/VariyamC00},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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