BibTeX record journals/todaes/Al-YamaniM05

download as .bib file

@article{DBLP:journals/todaes/Al-YamaniM05,
  author       = {Ahmad A. Al{-}Yamani and
                  Edward J. McCluskey},
  title        = {Test chip experimental results on high-level structural test},
  journal      = {{ACM} Trans. Design Autom. Electr. Syst.},
  volume       = {10},
  number       = {4},
  pages        = {690--701},
  year         = {2005},
  url          = {https://doi.org/10.1145/1109118.1109125},
  doi          = {10.1145/1109118.1109125},
  timestamp    = {Tue, 06 Nov 2018 12:51:48 +0100},
  biburl       = {https://dblp.org/rec/journals/todaes/Al-YamaniM05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.