BibTeX record journals/tr/0001SL16

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@article{DBLP:journals/tr/0001SL16,
  author       = {Narayanaswamy Balakrishnan and
                  Hon Yiu So and
                  Man Ho Ling},
  title        = {A Bayesian Approach for One-Shot Device Testing With Exponential Lifetimes
                  Under Competing Risks},
  journal      = {{IEEE} Trans. Reliab.},
  volume       = {65},
  number       = {1},
  pages        = {469--485},
  year         = {2016},
  url          = {https://doi.org/10.1109/TR.2015.2440235},
  doi          = {10.1109/TR.2015.2440235},
  timestamp    = {Thu, 09 Jul 2020 22:46:59 +0200},
  biburl       = {https://dblp.org/rec/journals/tr/0001SL16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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