BibTeX record journals/tvlsi/MorenoRC16

download as .bib file

@article{DBLP:journals/tvlsi/MorenoRC16,
  author       = {Jes{\'{u}}s Moreno and
                  Michel Renovell and
                  V{\'{\i}}ctor H. Champac},
  title        = {Effectiveness of Low-Voltage Testing to Detect Interconnect Open Defects
                  Under Process Variations},
  journal      = {{IEEE} Trans. Very Large Scale Integr. Syst.},
  volume       = {24},
  number       = {1},
  pages        = {378--382},
  year         = {2016},
  url          = {https://doi.org/10.1109/TVLSI.2015.2397934},
  doi          = {10.1109/TVLSI.2015.2397934},
  timestamp    = {Thu, 10 Mar 2022 13:57:16 +0100},
  biburl       = {https://dblp.org/rec/journals/tvlsi/MorenoRC16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.