BibTeX record journals/tvlsi/NakamuraCSF07

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@article{DBLP:journals/tvlsi/NakamuraCSF07,
  author       = {Yoshiyuki Nakamura and
                  Thomas Clouqueur and
                  Kewal K. Saluja and
                  Hideo Fujiwara},
  title        = {Diagnosing At-Speed Scan {BIST} Circuits Using a Low Speed and Low
                  Memory Tester},
  journal      = {{IEEE} Trans. Very Large Scale Integr. Syst.},
  volume       = {15},
  number       = {7},
  pages        = {790--800},
  year         = {2007},
  url          = {https://doi.org/10.1109/TVLSI.2007.899235},
  doi          = {10.1109/TVLSI.2007.899235},
  timestamp    = {Wed, 11 Mar 2020 18:18:27 +0100},
  biburl       = {https://dblp.org/rec/journals/tvlsi/NakamuraCSF07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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