"Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits."

Sandeep Kumar Goel, Krishnendu Chakrabarty (2014)

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metadata version: 2020-06-05

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Sandeep Kumar Goel, Krishnendu Chakrabarty:
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits. CRC Press 2014, ISBN 978-1-439-82941-7 [contents]

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