"Reliability aspects of 3D-oriented heterogeneous device design related to ..."

Grzegorz Janczyk et al. (2009)

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DOI: 10.1109/3DIC.2009.5306538

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

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Grzegorz Janczyk, Tomasz Bieniek, Jerzy Szynka, Piotr Grabiec:
Reliability aspects of 3D-oriented heterogeneous device design related to stress sensitivity of MOS transistors. 3DIC 2009: 1-6

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