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"Supply current testing of open defects at interconnects in 3D Ics with ..."

Tomoaki Konishi, Hiroyuki Yotsuyanagi, Masaki Hashizume (2011)

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DOI: 10.1109/3DIC.2012.6262968

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

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Tomoaki Konishi, Hiroyuki Yotsuyanagi, Masaki Hashizume:
Supply current testing of open defects at interconnects in 3D Ics with IEEE 1149.1 architecture. 3DIC 2011: 1-6

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