"A Deep Learning-Based Approach for Quality Control and Defect Detection ..."

Mathieu Juncker et al. (2020)

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DOI: 10.1109/ICCICC50026.2020.9450251

access: closed

type: Conference or Workshop Paper

metadata version: 2021-06-18

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Mathieu Juncker, Ismaïl Khriss, Jean Brousseau, Steven Pigeon, Alexis Darisse, Billy Lapointe:
A Deep Learning-Based Approach for Quality Control and Defect Detection for Industrial Bagging Systems. IEEE ICCI*CC 2020: 60-67

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