"Exploring the Relationship Between Samples and Masks for Robust Defect ..."

Jiang Lin et al. (2025)

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DOI: 10.1609/AAAI.V39I11.33324

access: open

type: Conference or Workshop Paper

metadata version: 2025-04-17

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Jiang Lin, Hui Xue, Fanxiu Sun, Yaping Yan:
Exploring the Relationship Between Samples and Masks for Robust Defect Localization. AAAI 2025: 12156-12164

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