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"FIMIL : A high-throughput deep learning model for abnormality detection ..."

Jing Ke et al. (2020)

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DOI: 10.1145/3373017.3373051

access: closed

type: Conference or Workshop Paper

metadata version: 2020-02-09

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  dblp key:
  - conf/acsw/KeLLJLJ20
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  - https://dblp.org/rec/conf/acsw/KeLLJLJ20
Jing Ke, Changchang Liu, Yizhou Lu, Naifeng Jing, Xiaoyao Liang, Fusong Jiang:
FIMIL : A high-throughput deep learning model for abnormality detection with weak annotation in microscopy images. ACSW 2020: 34:1-34:6

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