"Design and simulation of atomic force profiling of high aspect ratio ..."

J. J. Benjamin Biemond et al. (2018)

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DOI: 10.1109/AIM.2018.8452305

access: closed

type: Conference or Workshop Paper

metadata version: 2019-02-04

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J. J. Benjamin Biemond, Rodolf W. Herfst, Samaneh Mashaghi, Bert Dekker, Tom Bijnagte, Hamed Sadeghian:
Design and simulation of atomic force profiling of high aspect ratio samples using 2D subresonant force spectroscopy. AIM 2018: 136-143

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