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"Testing techniques for resistive-open defects in future CMOS technologies."

Mohammad Fawaz et al. (2010)

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DOI: 10.1109/APCCAS.2010.5774897

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-21

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Mohammad Fawaz, Nader Kobrosli, Ali Chehab, Ayman I. Kayssi:
Testing techniques for resistive-open defects in future CMOS technologies. APCCAS 2010: 256-259

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