"Negative ESD robustness of a novel anti-ESD TGFPTD SOI LDMOS."

Haipeng Zhang et al. (2010)

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DOI: 10.1109/APCCAS.2010.5775049

access: closed

type: Conference or Workshop Paper

metadata version: 2025-05-15

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Haipeng Zhang, Liang Zhang, Dejun Wang, Guohua Liu, Mi Lin, Xiaoyan Niu, Lingyan Fan:
Negative ESD robustness of a novel anti-ESD TGFPTD SOI LDMOS. APCCAS 2010: 1227-1230

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