"Analysis of Thermal-Induced Shunt Current Sensor Errors in a Low-Cost ..."

Alessandro Verani et al. (2021)

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DOI: 10.1007/978-3-030-95498-7_15

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-21

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  - conf/applepies/VeraniRBRS21
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Alessandro Verani, Roberto Di Rienzo, Federico Baronti, Roberto Roncella, Roberto Saletti:
Analysis of Thermal-Induced Shunt Current Sensor Errors in a Low-Cost Battery Management System. ApplePies 2021: 107-113

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