"Software Defect Prediction and Localization with Attention-Based Models ..."

Tianhang Zhang et al. (2020)

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DOI: 10.1109/APSEC51365.2020.00016

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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Tianhang Zhang, Qingfeng Du, Jincheng Xu, Jiechu Li, Xiaojun Li:
Software Defect Prediction and Localization with Attention-Based Models and Ensemble Learning. APSEC 2020: 81-90

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