"YOLO-VanNet: An Improved YOLOv5 Method for PCB Surface Defect Detection."

Fanglin Chen et al. (2024)

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DOI: 10.1007/978-981-97-7232-2_30

access: closed

type: Conference or Workshop Paper

metadata version: 2024-09-09

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Fanglin Chen, Chenyang Shi, Donglin Zhu, Changjun Zhou:
YOLO-VanNet: An Improved YOLOv5 Method for PCB Surface Defect Detection. APWeb/WAIM (1) 2024: 451-465

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