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"Evaluation of Null Method for Operational Amplifier Short-Time Testing."
Riho Aoki et al. (2019)
- Riho Aoki, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Shogo Katayama, Yuto Sasaki, Kosuke Machida, Takayuki Nakatani, Jianlong Wang, Anna Kuwana, Kazumi Hatayama, Haruo Kobayashi:
Evaluation of Null Method for Operational Amplifier Short-Time Testing. ASICON 2019: 1-4
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