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"Novel gate-voltage-bias techniques for gate-coupled MOS (GCMOS) ESD ..."

Guangyi Lu et al. (2013)

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DOI: 10.1109/ASICON.2013.6811960

access: closed

type: Conference or Workshop Paper

metadata version: 2022-07-15

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  dblp key:
  - conf/asicon/LuWCJZZ13
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Guangyi Lu, Yuan Wang, Jian Cao, Song Jia, Ganggang Zhang, Xing Zhang:
Novel gate-voltage-bias techniques for gate-coupled MOS (GCMOS) ESD protection circuits. ASICON 2013: 1-4

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