"Enhancing Temperature Immunity of Digital Circuit Against Aging : The ..."

Mingyue Zheng et al. (2023)

> Home

Details and statistics

DOI: 10.1109/ASICON58565.2023.10396237

access: closed

type: Conference or Workshop Paper

metadata version: 2025-04-01

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/asicon/ZhengCLCCC23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/asicon/ZhengCLCCC23
Mingyue Zheng, Wangyong Chen, Yaoyang Lyu, Haifeng Chen, Jiahui Chen, Linlin Cai:
Enhancing Temperature Immunity of Digital Circuit Against Aging : The Standard Cell Subset Method. ASICON 2023: 1-4

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.