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"Efficient sensitivity-based capacitance modeling for systematic and random ..."

Yu Bi, Pieter Harpe, N. P. van der Meijs (2011)

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DOI: 10.1109/ASPDAC.2011.5722262

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/aspdac/BiHM11
Yu Bi, Pieter Harpe, N. P. van der Meijs:
Efficient sensitivity-based capacitance modeling for systematic and random geometric variations. ASP-DAC 2011: 61-66

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