"Test compression for scan circuits using scan polarity adjustment and ..."

Yasumi Doi et al. (2005)

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DOI: 10.1145/1120725.1120744

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-03

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Yasumi Doi, Seiji Kajihara, Xiaoqing Wen, Lei Li, Krishnendu Chakrabarty:
Test compression for scan circuits using scan polarity adjustment and pinpoint test relaxation. ASP-DAC 2005: 59-64

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