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"NBTI induced performance degradation in logic and memory circuits: how ..."
Kunhyuk Kang et al. (2008)
- Kunhyuk Kang, Saakshi Gangwal, Sang Phill Park, Kaushik Roy:
NBTI induced performance degradation in logic and memory circuits: how effectively can we approach a reliability solution? ASP-DAC 2008: 726-731
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