"Experience in critical path selection for deep sub-micron delay test and ..."

Jing-Jia Liou et al. (2003)

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DOI: 10.1145/1119772.1119940

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Jing-Jia Liou, Li-C. Wang, Angela Krstic, Kwang-Ting Cheng:
Experience in critical path selection for deep sub-micron delay test and timing validation. ASP-DAC 2003: 751-756

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