"Efficient loop-back testing of on-chip ADCs and DACs."

Hak-soo Yu et al. (2003)

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DOI: 10.1145/1119772.1119919

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Hak-soo Yu, Jacob A. Abraham, Sungbae Hwang, Jeongjin Roh:
Efficient loop-back testing of on-chip ADCs and DACs. ASP-DAC 2003: 651-656

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