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"Energy efficiency degradation caused by random variation in low-voltage ..."

Atsushi Kawasumi et al. (2011)

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DOI: 10.1109/ASSCC.2011.6123628

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Atsushi Kawasumi, Toshikazu Suzuki, Shinichi Moriwaki, Shinji Miyano:
Energy efficiency degradation caused by random variation in low-voltage SRAM and 26% energy reduction by Bitline Amplitude Limiting (BAL) scheme. A-SSCC 2011: 165-168

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