"DP-BIST: A Built-In Self Test For DSP DataPaths A Low Overhead and High ..."

Saman Adham, Sanjay Gupta (1996)

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DOI: 10.1109/ATS.1996.555160

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Saman Adham, Sanjay Gupta:
DP-BIST: A Built-In Self Test For DSP DataPaths A Low Overhead and High Fault Coverage Technique. Asian Test Symposium 1996: 205-212

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